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  • Scanning Electron microscope with focussed ion beam (FIB-SEM).
  • Installed end of 2021.
  • Latest maps, AutoTEM software.
  • iFLM attachment for correlative experiments.
  • Often used for milling cells and viral protein crystals, lift-out experiments.
  • Low contamination rate modification implemented and tested.



Arctis pFIB-SEM

  • Plasma FIB-SEM. The first of this generation in the UK!
  • Installed end of 2023.
  • Latest software.
  • iFLM for correlative experiments.
  • Autoloader for high throughput grid milling, and easy loading to TEM microscopes.
  • Very low contamination rate!